M. A. Belaïd, K. Ketata, M. Gares, K. Mourgues, M. Masmoudi, J. Marcon. Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectronics Reliability, 47(1):59-64, 2007. [doi]
@article{BelaidKGMMM07,
title = {Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests},
author = {M. A. Belaïd and K. Ketata and M. Gares and K. Mourgues and M. Masmoudi and J. Marcon},
year = {2007},
doi = {10.1016/j.microrel.2006.04.009},
url = {http://dx.doi.org/10.1016/j.microrel.2006.04.009},
tags = {testing, analysis, reliability},
researchr = {https://researchr.org/publication/BelaidKGMMM07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {1},
pages = {59-64},
}