A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip

Giovanni Beltrame, Cristiana Bolchini, Luca Fossati, Antonio Miele, Donatella Sciuto. A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 132-141, IEEE Computer Society, 2007. [doi]

Authors

Giovanni Beltrame

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Cristiana Bolchini

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Luca Fossati

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Antonio Miele

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Donatella Sciuto

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