Giovanni Beltrame, Cristiana Bolchini, Luca Fossati, Antonio Miele, Donatella Sciuto. A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 132-141, IEEE Computer Society, 2007. [doi]
@inproceedings{BeltrameBFMS07, title = {A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip}, author = {Giovanni Beltrame and Cristiana Bolchini and Luca Fossati and Antonio Miele and Donatella Sciuto}, year = {2007}, doi = {10.1109/DFT.2007.35}, url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.35}, tags = {reliability}, researchr = {https://researchr.org/publication/BeltrameBFMS07}, cites = {0}, citedby = {0}, pages = {132-141}, booktitle = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy}, editor = {Cristiana Bolchini and Yong-Bin Kim and Adelio Salsano and Nur A. Touba}, publisher = {IEEE Computer Society}, isbn = {0-7695-2885-6}, }