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Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer. Delay Fault Diagnosis in Sequential Circuits. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 355-360, IEEE Computer Society, 2009. [doi]

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