Delay Fault Diagnosis in Sequential Circuits

Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer. Delay Fault Diagnosis in Sequential Circuits. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 355-360, IEEE Computer Society, 2009. [doi]

@inproceedings{BenabboudBDGPVR09,
  title = {Delay Fault Diagnosis in Sequential Circuits},
  author = {Youssef Benabboud and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Olivia Riewer},
  year = {2009},
  doi = {10.1109/ATS.2009.16},
  url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.16},
  researchr = {https://researchr.org/publication/BenabboudBDGPVR09},
  cites = {0},
  citedby = {0},
  pages = {355-360},
  booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-3864-8},
}