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Characterization of conducted emission at high frequency under different temperature

N. Berbel, Raúl Fernández-García, Ignacio Gil. Characterization of conducted emission at high frequency under different temperature. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 147-151, IEEE, 2013. [doi]

Authors

N. Berbel

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Raúl Fernández-García

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Ignacio Gil

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