W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter. Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability, 46(9-11):1736-1740, 2006. [doi]
@article{BergbauerLFB06,
title = {Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures},
author = {W. Bergbauer and T. Lutz and Werner Frammelsberger and Guenther Benstetter},
year = {2006},
doi = {10.1016/j.microrel.2006.07.064},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.064},
researchr = {https://researchr.org/publication/BergbauerLFB06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1736-1740},
}