Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures

W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter. Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability, 46(9-11):1736-1740, 2006. [doi]