On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 1120, IEEE Computer Society, 2002. [doi]

This author has not been identified. Look up 'Vincent Beroulle' in GoogleThis author has not been identified. Look up 'Yves Bertrand' in GoogleThis author has not been identified. Look up 'Laurent Latorre' in GoogleThis author has not been identified. Look up 'Pascal Nouet' in Google

runs on WebDSL