On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems - researchr publication

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Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 1120, IEEE Computer Society, 2002. [doi]

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