Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 1120, IEEE Computer Society, 2002. [doi]
@inproceedings{BeroulleBLN02:0,
title = {On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems},
author = {Vincent Beroulle and Yves Bertrand and Laurent Latorre and Pascal Nouet},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/date/2002/1471/00/14711120.pdf},
tags = {rule-based, testing, Pascal},
researchr = {https://researchr.org/publication/BeroulleBLN02%3A0},
cites = {0},
citedby = {0},
pages = {1120},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1471-5},
}