Safa Berrima, Yves Blaquière, Yvon Savaria. Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. Integration, 62:159-169, 2018. [doi]
@article{BerrimaBS18,
title = {Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits},
author = {Safa Berrima and Yves Blaquière and Yvon Savaria},
year = {2018},
doi = {10.1016/j.vlsi.2018.02.010},
url = {https://doi.org/10.1016/j.vlsi.2018.02.010},
researchr = {https://researchr.org/publication/BerrimaBS18},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {62},
pages = {159-169},
}