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Safa Berrima, Yves Blaquière, Yvon Savaria. Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. Integration, 62:159-169, 2018. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Design and validation of a novel reconfigurable and defect tolerant JTAG scan chainYves Blaquière, Yan Basile-Bellavance, Safa Berrima, Yvon Savaria. iscas 2014: 2559-2562 [doi] Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated CircuitGontran Sion, Yves Blaquière, Yvon Savaria. iolts 2015: 83-88 [doi] Defect and Fault Tolerant Scan ChainsRachid Kermouche, Yvon Savaria. dft 1994: 185-193
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