Defect and Fault Tolerant Scan Chains - researchr publication

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Rachid Kermouche, Yvon Savaria. Defect and Fault Tolerant Scan Chains. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 185-193, IEEE Computer Society, 1994.

Abstract is missing.

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