Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits - researchr publication references

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Safa Berrima, Yves Blaquière, Yvon Savaria. Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. Integration, 62:159-169, 2018. [doi]

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