A Unifying Methodology for Intellectual Property and Custom Logic Testing

Sandeep Bhatia, Tushar Gheewala, Prab Varma. A Unifying Methodology for Intellectual Property and Custom Logic Testing. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 639-648, IEEE Computer Society, 1996.

Abstract

Abstract is missing.