Basabi Bhaumik, G. S. Visweswaran, R. Lakshminarasimhan. A New Test Compression Scheme. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 95-99, IEEE Computer Society, 1999.
@inproceedings{BhaumikVL99,
title = {A New Test Compression Scheme},
author = {Basabi Bhaumik and G. S. Visweswaran and R. Lakshminarasimhan},
year = {1999},
tags = {testing},
researchr = {https://researchr.org/publication/BhaumikVL99},
cites = {0},
citedby = {0},
pages = {95-99},
booktitle = {12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India},
publisher = {IEEE Computer Society},
}