Basabi Bhaumik, G. S. Visweswaran, R. Lakshminarasimhan. A New Test Compression Scheme. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 95-99, IEEE Computer Society, 1999.
No references recorded for this publication.
No citations of this publication recorded.