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    A New Test Compression Scheme

    Basabi Bhaumik, G. S. Visweswaran, R. Lakshminarasimhan. A New Test Compression Scheme. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 95-99, IEEE Computer Society, 1999.

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