The impact of intrinsic device fluctuations on CMOS SRAM cell stability

Azeez J. Bhavnagarwala, Xinghai Tang, James D. Meindl. The impact of intrinsic device fluctuations on CMOS SRAM cell stability. J. Solid-State Circuits, 36(4):658-665, 2001. [doi]

Abstract

Abstract is missing.