Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks - researchr publication authors

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Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya. Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks. IEEE Trans. VLSI Syst., 26(6):1026-1039, 2018. [doi]

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