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Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya. Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks. IEEE Trans. VLSI Syst., 26(6):1026-1039, 2018. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and Diagnosing Interconnect Shorts in On-chip NetworksBiswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka. hpcc 2016: 530-537 [doi]
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