Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya. Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks. IEEE Trans. VLSI Syst., 26(6):1026-1039, 2018. [doi]
@article{BhowmikBDB18,
title = {Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks},
author = {Biswajit Bhowmik and Santosh Biswas and Jatindra Kumar Deka and Bhargab B. Bhattacharya},
year = {2018},
doi = {10.1109/TVLSI.2018.2803478},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2803478},
researchr = {https://researchr.org/publication/BhowmikBDB18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {26},
number = {6},
pages = {1026-1039},
}