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Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics

Shu-Yung Bin, Shih-Feng Lin, Ya Ching Cheng, Wen-Rong Liau, Alex Hou, Mango C.-T. Chao. Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics. IEEE Trans. VLSI Syst., 24(2):625-637, 2016. [doi]

Authors

Shu-Yung Bin

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Shih-Feng Lin

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Ya Ching Cheng

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Wen-Rong Liau

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Alex Hou

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Mango C.-T. Chao

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