Shu-Yung Bin, Shih-Feng Lin, Ya Ching Cheng, Wen-Rong Liau, Alex Hou, Mango C.-T. Chao. Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics. IEEE Trans. VLSI Syst., 24(2):625-637, 2016. [doi]
Abstract is missing.