Shu-Yung Bin, Shih-Feng Lin, Ya Ching Cheng, Wen-Rong Liau, Alex Hou, Mango C.-T. Chao. Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics. IEEE Trans. VLSI Syst., 24(2):625-637, 2016. [doi]
@article{BinLCLHC16,
title = {Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics},
author = {Shu-Yung Bin and Shih-Feng Lin and Ya Ching Cheng and Wen-Rong Liau and Alex Hou and Mango C.-T. Chao},
year = {2016},
doi = {10.1109/TVLSI.2015.2418998},
url = {http://dx.doi.org/10.1109/TVLSI.2015.2418998},
researchr = {https://researchr.org/publication/BinLCLHC16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {24},
number = {2},
pages = {625-637},
}