Massimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza. Reduction of Fault Detection Costs through Testable Design of Sequential Architectures with Signal Feedbacks. In Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli, editors, The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. pages 223-230, IEEE Computer Society, 1993.
Abstract is missing.