Simone Borri, Magali Hage-Hassan, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel. Defect-oriented dynamic fault models for embedded-SRAMs. In 8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003. pages 23-28, IEEE Computer Society, 2003. [doi]
Abstract is missing.