An accurate statistical yield model for CMOS current-steering D/A converters

A. Van den Bosch, M. Steyaert, W. Sansen. An accurate statistical yield model for CMOS current-steering D/A converters. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 105-108, IEEE, 2000. [doi]

Authors

A. Van den Bosch

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M. Steyaert

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W. Sansen

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