An accurate statistical yield model for CMOS current-steering D/A converters

A. Van den Bosch, M. Steyaert, W. Sansen. An accurate statistical yield model for CMOS current-steering D/A converters. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 105-108, IEEE, 2000. [doi]

@inproceedings{BoschSS00a,
  title = {An accurate statistical yield model for CMOS current-steering D/A converters},
  author = {A. Van den Bosch and M. Steyaert and W. Sansen},
  year = {2000},
  doi = {10.1109/ISCAS.2000.858699},
  url = {https://doi.org/10.1109/ISCAS.2000.858699},
  researchr = {https://researchr.org/publication/BoschSS00a},
  cites = {0},
  citedby = {0},
  pages = {105-108},
  booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings},
  publisher = {IEEE},
}