A. Van den Bosch, M. Steyaert, W. Sansen. An accurate statistical yield model for CMOS current-steering D/A converters. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 105-108, IEEE, 2000. [doi]
Abstract is missing.