An effective ATPG flow for Gate Delay Faults - researchr publication authors

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda. An effective ATPG flow for Gate Delay Faults. In 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, April 21-23, 2015. pages 1-6, IEEE, 2015. [doi]

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