Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Leonardo Bonet Zordan. An effective BIST architecture for power-gating mechanisms in low-power SRAMs. In 17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016. pages 185-191, IEEE, 2016. [doi]
Abstract is missing.