Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test - researchr publication authors

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Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, Fady Abouzeid, Sylvain Clerc, Lirida A. B. Naviner, Philippe Roche. Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 12, IEEE, 2015. [doi]

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