Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, Fady Abouzeid, Sylvain Clerc, Lirida A. B. Naviner, Philippe Roche. Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 12, IEEE, 2015. [doi]
@inproceedings{BottoniCDGACNR15,
title = {Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test},
author = {Cyril Bottoni and Benjamin Coeffic and Jean-Marc Daveau and Gilles Gasiot and Fady Abouzeid and Sylvain Clerc and Lirida A. B. Naviner and Philippe Roche},
year = {2015},
doi = {10.1109/IRPS.2015.7112830},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112830},
researchr = {https://researchr.org/publication/BottoniCDGACNR15},
cites = {0},
citedby = {0},
pages = {12},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}