J. Bourgeat, Philippe Galy, A. Dray, J. Jimenez, D. Marin-Cudraz, B. Jacquier. A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node. Microelectronics Reliability, 51(9-11):1614-1617, 2011. [doi]
@article{BourgeatGDJMJ11, title = {A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node}, author = {J. Bourgeat and Philippe Galy and A. Dray and J. Jimenez and D. Marin-Cudraz and B. Jacquier}, year = {2011}, doi = {10.1016/j.microrel.2011.07.078}, url = {http://dx.doi.org/10.1016/j.microrel.2011.07.078}, researchr = {https://researchr.org/publication/BourgeatGDJMJ11}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {51}, number = {9-11}, pages = {1614-1617}, }