Keith A. Bowman, James W. Tschanz, Nam Sung Kim, Janice C. Lee, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek K. De. Energy-Efficient and Metastability-Immune Timing-Error Detection and Instruction-Replay-Based Recovery Circuits for Dynamic-Variation Tolerance. In 2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008. pages 402-403, IEEE, 2008. [doi]
Abstract is missing.