Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance

Keith A. Bowman, James W. Tschanz, Nam Sung Kim, Janice C. Lee, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek K. De. Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance. J. Solid-State Circuits, 44(1):49-63, 2009. [doi]

@article{BowmanTKLWLKD09,
  title = {Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance},
  author = {Keith A. Bowman and James W. Tschanz and Nam Sung Kim and Janice C. Lee and Chris Wilkerson and Shih-Lien Lu and Tanay Karnik and Vivek K. De},
  year = {2009},
  doi = {10.1109/JSSC.2008.2007148},
  url = {https://doi.org/10.1109/JSSC.2008.2007148},
  researchr = {https://researchr.org/publication/BowmanTKLWLKD09},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {44},
  number = {1},
  pages = {49-63},
}