Arthur T. Bradley, Richard C. Jaeger, Jeffrey C. Suhling, Y. Zou. Test chips for die stress characterization using arrays of CMOS sensors. In Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, CICC 1999, San Diego, CA, USA, May 1649,1999. pages 147-150, IEEE, 1999. [doi]
Abstract is missing.