P. Brahic, Régis Leveugle, Gabriele Saucier. Design of defect-tolerant scan chains for MCMs with an active substrate. In 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995. pages 252-260, IEEE Computer Society, 1995. [doi]
Abstract is missing.