A. Bravaix, M. Saliva, Florian Cacho, X. Federspiel, C. Ndiaye, S. Mhira, E. Kussener, E. Pauly, Vincent Huard. Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 43-46, IEEE, 2016. [doi]
@inproceedings{BravaixSCFNMKPH16,
title = {Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes},
author = {A. Bravaix and M. Saliva and Florian Cacho and X. Federspiel and C. Ndiaye and S. Mhira and E. Kussener and E. Pauly and Vincent Huard},
year = {2016},
doi = {10.1109/IOLTS.2016.7604669},
url = {http://dx.doi.org/10.1109/IOLTS.2016.7604669},
researchr = {https://researchr.org/publication/BravaixSCFNMKPH16},
cites = {0},
citedby = {0},
pages = {43-46},
booktitle = {22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1507-8},
}