The following publications are possibly variants of this publication:
- Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profilingRoland Biberger, Guenther Benstetter, Thomas Schweinboeck, Peter Breitschopf, Holger Goebel. mr, 48(8-9):1339-1342, 2008. [doi]
- Displacement current sensor for contact and intermittent contact scanning capacitance microscopyRoland Biberger, Guenther Benstetter, Holger Goebel. mr, 49(9-11):1192-1195, 2009. [doi]
- Intermittent-contact capacitance spectroscopy - A new method for determining C(V) curves with sub-micron lateral resolutionRoland Biberger, Guenther Benstetter, Holger Goebel, Alexander Hofer. mr, 50(9-11):1511-1513, 2010. [doi]