Franc Brglez, David Bryan, John D. Calhoun, Robert Lisanke. A modular scan-based testability system. In Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988. pages 408-412, IEEE, 1988. [doi]
@inproceedings{BrglezBCL88,
title = {A modular scan-based testability system},
author = {Franc Brglez and David Bryan and John D. Calhoun and Robert Lisanke},
year = {1988},
doi = {10.1109/ICCD.1988.25733},
url = {https://doi.org/10.1109/ICCD.1988.25733},
researchr = {https://researchr.org/publication/BrglezBCL88},
cites = {0},
citedby = {0},
pages = {408-412},
booktitle = {Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988},
publisher = {IEEE},
isbn = {0-8186-0872-2},
}