Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing - researchr publication authors

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Franc Brglez, Philip Pownall, Robert Hum. Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 705-712, IEEE Computer Society, 1984.

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