Franc Brglez, Philip Pownall, Robert Hum. Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 705-712, IEEE Computer Society, 1984.
@inproceedings{BrglezPH84,
title = {Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing},
author = {Franc Brglez and Philip Pownall and Robert Hum},
year = {1984},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/BrglezPH84},
cites = {0},
citedby = {0},
pages = {705-712},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
publisher = {IEEE Computer Society},
}