Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas. In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{BrozekCWQCSHS23,
title = {In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk},
author = {Tomasz Brozek and Alberto A. P. Cattaneo and Larg Weiland and Michele Quarantelli and Alberto Coccoli and Sharad Saxena and Christopher Hess and Andrzej J. Strojwas},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118144},
url = {https://doi.org/10.1109/IRPS48203.2023.10118144},
researchr = {https://researchr.org/publication/BrozekCWQCSHS23},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}