Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas. In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.