Body effect induced wear-out acceleration in ultra-thin oxides

S. Bruyère, D. Roy, E. Robilliart, E. Vincent, G. Ghibaudo. Body effect induced wear-out acceleration in ultra-thin oxides. Microelectronics Reliability, 41(7):1031-1034, 2001. [doi]

Authors

S. Bruyère

This author has not been identified. Look up 'S. Bruyère' in Google

D. Roy

This author has not been identified. Look up 'D. Roy' in Google

E. Robilliart

This author has not been identified. Look up 'E. Robilliart' in Google

E. Vincent

This author has not been identified. Look up 'E. Vincent' in Google

G. Ghibaudo

This author has not been identified. Look up 'G. Ghibaudo' in Google