S. Bruyère, D. Roy, E. Robilliart, E. Vincent, G. Ghibaudo. Body effect induced wear-out acceleration in ultra-thin oxides. Microelectronics Reliability, 41(7):1031-1034, 2001. [doi]
@article{BruyereRRVG01,
title = {Body effect induced wear-out acceleration in ultra-thin oxides},
author = {S. Bruyère and D. Roy and E. Robilliart and E. Vincent and G. Ghibaudo},
year = {2001},
doi = {10.1016/S0026-2714(01)00065-8},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00065-8},
tags = {e-science},
researchr = {https://researchr.org/publication/BruyereRRVG01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {7},
pages = {1031-1034},
}