The following publications are possibly variants of this publication:
- A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance MicroscopyMaria Stangoni, Mauro Ciappa, Wolfgang Fichtner. mr, 43(9-11):1651-1656, 2003. [doi]
- Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-JunctionMaria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner. mr, 42(9-11):1701-1706, 2002. [doi]
- Diamond-Coated Cantilevers for Scanning Capacitance Microscopy ApplicationsH. Yabuhara, Mauro Ciappa, Wolfgang Fichtner. mr, 41(9-10):1459-1463, 2001.